Monday 24 to Tuesday 25 November 2008
Organised by Dr Andrew Bleloch, Professor David Cockayne FRS, Professor Angus Kirkland and Dr Peter Nellist
Please find below MP3 audio files recorded at this discussion meeting for the following talks and discussions. View further details of this meeting including abstracts.
Session 1 - Aberration Correction: History and Instrumentation
Peter Hawkes
Aberration correction, past and present
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Max Haider
Current and future aberration correctors for the improvement of resolution in EM
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Ondrej Krivanek
Aberration-Corrected STEM and EELS
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Joachim Zach
Chromatic correction: A revolution in electron microscopy?
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Session 2 - Advanced applications of aberration correction
Hannes Lichte
Electron holography in an aberration corrected TEM
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Knut Urban
Atomic Resolution Studies on Oxides by aberration-corrected transmission electron microscopy
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Angus Kirkland
Applications of Aberration Correction and Exit Wave Reconstruction in Studies of Nanoparticles
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Andrew Bleloch
Aberration corrected STEM analysis: Getting to know your probe
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Session 3 - Advanced applications of aberration correction II
Steve J Pennycook
Solving energy problems through aberration-corrected STEM
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David A. Muller
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
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Chris Boothroyd
Moving atoms imaged with aberration corrected focal series
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Pratibha L Gai
Dynamic In-Situ Nanoparticle Sintering Experiments in a 1Å Double Aberration Corrected Environment
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Etienne Snoeck
The SACTEM in Toulouse
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Ute Kaiser
Atomic resolution low-voltage electron microscopy - current status and future prospects
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Nobuo Tanaka
Application of Cs-corrected TEM/STEM to nano-materials and its future prospects
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Masashi Watanabe
X-ray Analysis in Aberration-corrected Analytical Electron Microscopy: Towards Atomic-column XEDS Imaging
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Yimei Zhu
Single atom spectroscopy: dream or reality ? the performance of the aberration corrected Hitachi HD2700 STEM
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Session 4 - Future directions
Ulrich Dahmen
Toward an Electron-Optical Observatory of the Nanoworld an Update on the TEAM Project
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Harald H Rose
Future trends in aberration-corrected electron microscopy
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Peter Nellist
The depth of focus in aberration-corrected STEM: A problem or an opportunity?
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Christian Colliex
Enabling the exploration of the nanoworld with the new generation of electron microscopes
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Archie Howie FRS
Overview and future direction: Aberration Correction Zooming out to Overview
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