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Organised by Professor Xiangqian Jane Jiang and Professor David Whitehouse
Following on from the Royal Society Discussion meeting, this Satellite meeting explores advanced metrology for precision engineering by examining the mathematical fundaments, physical principles, methodologies, characterisation analysis, and possible solutions to some of the measurement challenges that are currently limiting future developments in precision engineering.
Experts in their field will discuss the future applications in precision engineering and the current technological restrictions on their measurement requirements. The satellite meeting will produce a vision that identifies the challenges in advanced metrology for precision engineering; anticipating that this will inspire academia and industry to address the solutions of these open problems.
Download the programme here (PDF).
Biographies and audio recordings are available below.
Professor David Whitehouse, Professor Emeritus, Warwick University, UK Challenges in miniaturisation
Professor Whitehouse graduated in Physics from Bristol University in 1958 and was awarded a PhD in Tribology by Leicester University in 1971, then a DSc in Metrology by the University of Warwick in 1986.
He began his professional career in 1958 as a development engineer becoming Chief Research Engineer (Taylor Hobson) the protégé of Dr R E Reason FRS. After 20 years in industry he moved to the University of Warwick first as Professor of Engineering Science later becoming Chief Scientist in the School of Engineering. He is regarded as the world authority on surface and nanometrology having lectured in 37 countries on these subjects. He holds 22 patents, has written more than 250 technical papers, and 5 books including the “Handbook of Surface Metrology”, now widely considered the classic in the field and more recently the “Handbook of Surface and Nanotechnology”( new edition). In 1990 he initiated the world’s first journal on Nanotechnology for the Institute of Physics. Whitehouse is a charter member of the American Society for Precision Engineering, a Fellow of the International Academy of Production Engineering (CIRP), and a past President of the Committee for Surface Roughness. He is a Fellow of the UK Institute of Physics, the Institute of Measurement and Control, the Institution of Production Engineers, and the Institution of Electrical Engineers. He is an Honorary Member of The Japanese Institution of Precision Engineers and a Senior Member of the Chinese Society of Mechanical Engineers.
He has received many prizes and honors throughout the world including a lifetime achievement award from, the American Society of Precision Engineers in which he is described as the ‘Father of digital metrology’.
Professor Xiangqian Jane Jiang, University of Huddersfield, UK Challenges in precision metrology
Professor Jane Jiang holds the Directorship for the EPSRC Centre in Advanced Metrology at the Universityof Huddersfield. She has a PhD in Surface Measurement Science and a DSc in Precision Engineering. Sheis a principle member of the ISO TC/213 committee “Dimensional Geometrical Produces Specification andVerification” and the BSI TW/4 committee "Engineering drawing, metrology, precision measurement",and a UK BIS/DIUS/DTI Measurement Advisory Committee Member.Jane Jiang’s main research includes: development of mathematical models and algorithms for form andsurface texture analysis, filtration and parametric characterisation; optical interferometry techniques formeasurement of ultra-precision micro/nano-scale surface topography. Professor Jiang has published over230 papers and author/co-authored 8 books on measurement science and surface/precision metrology.Jane is a current holder of a prestigious Advanced Researcher European Research Council award and aformer Royal Society – Wolfson Research Merit Award Holder. Jane was awarded the UK OutstandingAsian Woman of Achievement in 2006, and is an elected Fellow of both the IET and the RSA.
Professor Jane Jiang holds the Directorship for the EPSRC Centre in Advanced Metrology at the University
of Huddersfield. She has a PhD in Surface Measurement Science and a DSc in Precision Engineering. She
is a principle member of the ISO TC/213 committee “Dimensional Geometrical Produces Specification and
Verification” and the BSI TW/4 committee "Engineering drawing, metrology, precision measurement",
and a UK BIS/DIUS/DTI Measurement Advisory Committee Member.
Jane Jiang’s main research includes: development of mathematical models and algorithms for form and
surface texture analysis, filtration and parametric characterisation; optical interferometry techniques for
measurement of ultra-precision micro/nano-scale surface topography. Professor Jiang has published over
230 papers and author/co-authored 8 books on measurement science and surface/precision metrology.
Jane is a current holder of a prestigious Advanced Researcher European Research Council award and a
former Royal Society – Wolfson Research Merit Award Holder. Jane was awarded the UK Outstanding
Asian Woman of Achievement in 2006, and is an elected Fellow of both the IET and the RSA.
Nick Orchard, Rolls-Royce plc, UKChallenges in measurement practice
Nick Orchard is a Specialist Engineer with Rolls-Royce plc, and has spent over 30 years working in the field of dimensional measurement and inspection. He has been active in the improvement of shop-floor measurement systems for all types of engine components, and has led the development and implementation of a variety of new technologies for automated systems. He has particular experience with the use of coordinate measuring machines (CMMs), non-contact structured light systems and image processing for inspection. Current activities include the role of Global Process Owner for Dimensional Measurement in Rolls-Royce, which involves creating best-practice standards and guidelines for the selection and use of measurement systems for manufacturing.
Dr Andrew Lewis, National Physical Laboratory, UKDimensional metrology challenges: an NMI perspective
Andrew Lewis joined the National Physical Laboratory (NPL) in 1988 after graduating from the University of Cambridge with an honours degree in Natural Sciences. He was awarded a PhD from the University of London in 1994 for his work at NPL on the development of a phase-stepping interferometer for the measurement of engineering length standards. Since then, he has worked in many research subjects in dimensional metrology including phase-stepping interferometry, swing arm profilometry for aspheric optics, contact-based coordinate metrology, laser-based large-scale metrology and interferometer-based micro-scale coordinate metrology. He has designed, built, and programmed several world-class metrology instruments which are now sold commercially. He has managed NPL measurement services that are used by industry, as well as spending a short time as Group Leader of the Length Metrology group. Andrew represents NPL and the UK on several international committees including the CIPM’s Consultative Committee for Length the EURAMET Technical Committee for Length, which he chaired for four years. He has written and presented training courses in dimensional metrology, run several large international comparisons as well as provided contract R&D and consultancy for other metrology laboratories, precision engineering companies, and the European Space Agency.
Dipl-Phys Niels König, Fraunhofer Institute for Production Technology IPT, GermanyInline and in-process metrology: challenges and added value
Dipl-Phys Niels König was born in 1974 and graduated from the Technical University of Aachen with a degree in Physics and a specialisation on Solid-State Physics and Biomedical Engineering. Since 2007 he is a scientific staff member of Prof. Schmitt in the Department for Production Metrology at Fraunhofer Institute for Production Technology IPT. Since 2010 he heads the group for Fibre-optic Sensors as well as the group for Inline and In-Process Metrology. His focus of work lies in the design and fabrication of fibre-optic sensing probes and the integration of sensors into production processes.
Dr Haydn Martin, University of Huddersfield, UKOptical measurement systems
Dr Haydn Martin studied for a BEng in Electronic Engineering at the University of Leeds, graduating in 2002. He then moved on to complete an MSc in Embedded Systems Engineering at the University of Huddersfield and graduated with distinction in 2004.
Under the supervision of Professors Xiangqian (Jane) Jiang and Liam Blunt, Haydn undertook a PhD with the Surface Metrology Group at the Centre for Precision Technologies (CPT), University of Huddersfield. The research involved the development of a high precision wavelength scanning fibre optic interferometer for use nanoscale surface characterisation.
In 2009 Haydn was taken on as a Research Fellow at the CPT where he is investigating new methods of applying optical technologies in order to improve the current state of non-contact, online surface metrology. His research investigates novel use of optical fibre, acousto-optic tuneable filters, integrated optics and digital signal processing to provide improve the current capability for making on-line measurements at the micro and nanoscales. Improving metrology capability will be one of the key enablers for the effective manufacture and commercial viability of many ultra-precision technologies in the future.
Dr Simon Fletcher, University of Huddersfield, UK Machine tool metrology
Simon Fletcher is a Senior Research Fellow working within the Centre for Precision Technologies at the University of Huddersfield. With more than 14 years experience in machine tool accuracy improvement including error identification, avoidance and compensation, he has helped establish the group international reputation for research into machine tool precision.
Born in Northallerton, North Yorkshire he began studying engineering in 1989 at York college of Arts and Technology, completing a BTEC National Diploma in Computer Aided Engineering in 1991. Simon then received an Honors degree in 1995 from the University of Huddersfield after which he was invited to do a PhD by Professor Derek Ford. He defended his thesis titled 'Computer Aided System for Intelligent Implementation of Machine Tool Error Reduction Methodologies' in 2001. Since then, Simon has continued post doctoral research in this field of engineering and now works as a Senior Research Fellow in the Centre for Precision Technologies.
Simon is currently working on a number of European Framework 7 projects with the primary contribution being thermal compensation and various consultancy activities primarily involving detailed geometric and thermal performance assessments for aerospace companies.
Professor Paul Shore FREng, Cranfield University, UKFuture challenges in precision engineering
Professor Graham Machin, National Physical Laboratory, UKAddressing future high temperature measurement challenges
Professor Graham Machin earned his DPhil at the University of Oxford, Department of Astrophysics: DPhil “Cataclysmic variables in Globular Clusters and Low mass X-ray binaries” in 1991, before he joined the National Physical Laboratory. He has published more than 100 technical papers and given numerous invited talks in USA, South America, Europe and Japan on Thermometry related topics eg keynote addresses on quantative thermography QIRT (Krakow, Jul 2008), high temperature measurement Tempbeijing (China, Oct 2008) and new high temperature scale at Tempmeko ’10 (Jun 2010). He has been an invited guest researcher to NMIJ (Japan, twice) NIST (USA) and NIM (China) and is a Fellow of the Institute of Physics and of the Institute of Measurement and Control. He co-authored the major work “Radiometric temperature measurements” (Elsevier 2010). He is NPL’s representative on EURAMET TC Thermometry, CCT, chairs CCT-WG5 – “radiation thermometry”, Euramet TCT Strategy Group and IEC/ISO 60584 WG5 “Thermal Imager Specification standardisation”. Professor Machin is visiting Professor of Temperature Measurement at the University of Valladolid, Spain. Current research interests include primary thermometry (acoustic and radiometric), radiation thermometry and thermal imaging, clinical thermometry (contact, non-contact and internal), thermocouple developments (including self-validation methods) and high temperature measurements in hostile environments.
Professor Liam Blunt, University of Huddersfield, UKSurface and geometry measurement- future challenges
Professor Liam Blunt has a degree in Materials Technology and a PhD in "The Metallurgy of Centreless Ground surfaces". His Academic experience includes Post Doctoral period at Warwick University covering Microscopy of Thick and Thin Film Superconductors. Professor Blunt then moved onto Birmingham University researching a multi properties material tester. At Birmingham he developed an interest in tribology and surface metrology and was awarded a lectureship in 1992. In 1997 Professor Blunt moved to Huddersfield University and began developing the Centre for Precision Technologies. His research covers surface metrology and applications of functional surfaces as well as precision manufacturing processes. Professor Blunt has formed extensive industrial collaborations in particular with Taylor Hobson Ltd a world leading metrology company. Professor Blunt now holds the Taylor Hobson Chair of Surface Metrology.
Professor David D. Walker, University College London, UKSurface metrology for machine environments
David Walker is half-time Professorial Research Associate at UCL, and half-time University of Wales Professor of Optics at Glyndŵr University. He gained his PhD in astronomical instrumentation in 1980, and subsequently founded UCL’s Optical Science Laboratory. After working on cryogenic CCDs, he developed high-resolution optical spectrographs for 4-8m class telescopes, delivered numerous commissioned studies, and developed instrumentation sub-systems for some of the leading astronomical observatories around the world, and for industry. Professor Walker then went on to develop computer controlled polishing and metrology techniques. With industrialist Richard Freeman he formed Zeeko Ltd in 2000, and is current Research Director. In 2005 he moved from London to North Wales to establish the National Facility for Ultra-precision Surfaces at OpTIC-Technium (now OpTIC-Glyndŵr). He led the successful technical response that secured a €5m contract from the European Southern Observatory to manufacture seven 1.4m prototype mirror segments for the 42m European Extremely Large telescope. He currently leads the ESO project R&D team, and is in parallel developing new processing and measurement techniques for wider applications.
Professor Walker sits as an industry representative on HEFCW’s Research Innovation and Enterprise committee, and also the Parliamentary and Scientific Committee.
Professor Paul Scott, University of Huddersfield, UKInverse problems in metrology
Professor Paul J Scott holds the Chair in Computational Geometry, at the University of Huddersfield, with a research focused on mathematics, algorithms, intelligent knowledge systems, measurement, and geometrical characterisation of size, shape and texture.
Paul started his career at Taylor Hobson Ltd, Leicester: a world leader in the design and development of ultra-precision metrology instruments for surface texture and form. He spent twenty six years in the research department applying mathematical ideas and concepts to surface texture and form measuring instruments both during the development of instrumentation and post development for mathematical enhancements of the metrological capabilities of instrumentation.
Paul is also very actively involved with the formation of national and international standards: being chairman of BSI technical committee TDE/4/-/9 (Properties and Metrology of surfaces) and represents the UK on ISO technical committee TC/213 (Dimensional and geometrical product specification and verification-GPS). In the latter he is the convener of WG15 (Filtration and extraction) and AG12 (Mathematical support for GPS).
Professor Alistair Forbes, National Physical Laboratory, UKModelling systematic effects in coordinate metrology
Alistair Forbes studied mathematics at Aberdeen (BSc, 1977), Newcastle (MSc, 1978) and Pennsylvania (MA, 1984). Since joining NPL in 1985, he has carried out research in mathematical and statistical modelling, algorithm design, uncertainty evaluation, numerical software development and validation and has published over 120 papers and reports on the application of mathematics to metrology. His current research interests include: Bayesian inference, uncertainty evaluation and decision making, sensor networks and data fusion, computational approaches to coordinate metrology and surface assessment. He is an NPL Fellow in Mathematics and Scientific Computing, Visiting Professor of Industrial Mathematics at the University of Huddersfield, Scientific Secretary of IMEKO TC21, Mathematical Tools for Measurement, Chairman, ENBIS Special Interest Group on Measurement Uncertainty, and on the Scientific Programme Committee for international conferences on Advanced Mathematical and Computational Tools for Metrology (co-chair, 2011), Algorithms for Approximation, Laser Metrology and Machine Performance (co-chair, 2009), Measurement Systems and Process Improvement (chair 2010), Design of Industrial Experiments, European Society for Precision Engineering and Nanotechnology International Conference and Exhibition, and Metrology and Properties of Surfaces.
Public lecture 5 Dec
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