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New possibilities with aberration corrected electron microscopy









The Royal Society, London, 6-9 Carlton House Terrace, London, SW1Y 5AG



Organised by Dr Andrew Bleloch, Professor David Cockayne FRS, Professor Angus Kirkland and Dr Peter Nellist

In the past few years, the capabilities of electron microscopes have been transformed by the ability to overcome lens aberrations, in the way that spectacles transform poor sight. This is possibly the most significant development in microscopy in the past thirty years. This meeting will explore the opportunities that the new aberration correctors bring, and the challenges that remain.
Invited speakers: Professor Andrew Bleloch, Dr Chris Boothroyd, Professor Michael Brown FRS (Chair), Professor David Cockayne FRS (Chair), Professor Christian Colliex, Dr Ulrich Dahmen, Professor Pratibha Gai, Professor Peter Goodhew FREng (Chair), Dr Max Haider, Dr Peter Hawkes, Professor Archie Howie FRS, Professor Hannes Lichte, Professor Ute Kaiser, Professor Angus Kirkland, Dr Ondrej Krivanek, Professor David A Muller, Dr Peter Nellist, Dr Steve Pennycook, Professor Harald Rose, Professor John Silcox (Chair), Professor Etienne Snoeck, Professor John Spence  (Chair), Professor Nobuo Tanaka, Professor Knut Urban, Dr Masashi Watanabe, Dr Joachim Zach, Professor Yimei Zhu.
The proceedings of this meeting are scheduled to be published in a future issue of Philosophical Transactions A.

Schedule of talks

Session 1: Aberration Correction - History and Instrumentation

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Aberration correction, past and present

Peter Hawkes

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Current and future aberration correctors for the improvement of resolution in EM

Max Haider

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Aberration-Corrected STEM and EELS

Ondrej Krivanek

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Session 2: Advanced applications of aberration correction

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Hannes Lichte

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Atomic Resolution Studies on Oxides by aberration-corrected transmission electron microscopy

Knut Urban

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Applications of Aberration Correction and Exit Wave Reconstruction in Studies of Nanoparticles

Angus Kirkland

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Aberration corrected STEM analysis: Getting to know your probe

Andrew Bleloch

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Neural correlates of exceptional memory

Eleanor Maguire

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Session 3: Advanced applications of aberration correction II

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Solving energy problems through aberration-corrected STEM

Steve J Pennycook

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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

David A.Muller

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Moving atoms imaged with aberration corrected focal series

Chris Boothroyd

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Dynamic In-Situ Nanoparticle Sintering Experiments in a 1Å Double Aberration Corrected Environment

Pratibha L Gai

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The SACTEM in Toulouse

Etienne Snoeck

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Atomic resolution low-voltage electron microscopy - current status and future prospects

Ute Kaiser

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Application of Cs-corrected TEM/STEM to nano-materials and its future prospects

Professor Nobuo Tanaka, Nagoya University, Japan

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X-ray Analysis in Aberration-corrected Analytical Electron Microscopy: Towards Atomic-column XEDS Imaging

Masashi Watanabe

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Single atom spectroscopy: dream or reality ? the performance of the aberration corrected Hitachi HD2700 STEM

Yimei Zhu

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Session 4: Future directions

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Toward an Electron-Optical Observatory of the Nanoworld an Update on the TEAM Project

Ulrich Dahmen

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Future trends in aberration-corrected electron microscopy

Harald H Rose

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The depth of focus in aberration-corrected STEM: A problem or an opportunity?

Enabling the exploration of the nanoworld with the new generation of electron microscopes

Christian Colliex

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Overview and future direction: Aberration Correction Zooming out to Overview

Professor Archie Howie CBE FRS, University of Cambridge, UK

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New possibilities with aberration corrected electron microscopy

Discussion meeting organised by Dr Andrew Bleloch, Professor David Cockayne FRS, Professor Angus Kirkland and Dr Peter Nellist

The Royal Society, London 6-9 Carlton House Terrace London SW1Y 5AG UK
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