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/ Events

Precision measurement

14 - 15 July 2011 09:00 - 17:00

 

Organised by Professor Xiangqian Jane Jiang and Professor David Whitehouse

Following on from the Royal Society Discussion meeting, this Satellite meeting explores advanced metrology for precision engineering by examining the mathematical fundaments, physical principles, methodologies, characterisation analysis, and possible solutions to some of the measurement challenges that are currently limiting future developments in precision engineering.

Experts in their field will discuss the future applications in precision engineering and the current technological restrictions on their measurement requirements. The satellite meeting will produce a vision that identifies the challenges in advanced metrology for precision engineering; anticipating that this will inspire academia and industry to address the solutions of these open problems.

Download the programme here (PDF).

Biographies and audio recordings are available below.

Organisers

  • Professor David Whitehouse, Professor Emeritus, Warwick University, UK

    Professor Whitehouse graduated in Physics from Bristol University in 1958 and was awarded a PhD in Tribology by Leicester University in 1971, then a DSc in Metrology by the University of Warwick in 1986.

    He  began his professional career in 1958 as a development engineer becoming  Chief Research Engineer (Taylor Hobson)  the protégé of Dr R E Reason FRS.  After 20 years in industry he moved to the University of Warwick first as Professor of  Engineering  Science  later becoming Chief Scientist in the School of Engineering. He is regarded as the world authority on surface and nanometrology having lectured in 37 countries on these subjects. He holds 22 patents,  has written more than 250 technical papers, and 5 books including the “Handbook of Surface Metrology”, now widely considered the classic in the field and more recently the “Handbook of Surface and Nanotechnology”( new edition).  In 1990 he initiated the world’s first journal on Nanotechnology for the Institute of Physics. Whitehouse is a charter member of the American Society for Precision Engineering, a Fellow of the International Academy of Production Engineering (CIRP), and a past President of the Committee for Surface Roughness. He is a Fellow of the UK Institute of Physics, the Institute of Measurement and Control, the Institution of Production Engineers, and the Institution of Electrical Engineers. He is an Honorary Member of The Japanese Institution of Precision Engineers and a Senior Member of the Chinese Society of Mechanical Engineers.

    He has received many prizes and honors throughout the world including a lifetime achievement award from, the American Society of Precision Engineers in which he is described as the ‘Father of digital metrology’.  

  • Professor Xiangqian Jane Jiang, University of Huddersfield, UK

    Professor Jane Jiang holds the Chair of Precision Metrology and Chief Scientist at the Centre for Precision Technologies, University of Huddersfield. She has a PhD in Surface Measurement Science and a DSc in Precision Engineering. She is a principle member of the ISO TC/213 committee “Dimensional Geometrical Produces Specification and Verification” and the BSI TW/4 committee "Engineering drawing, metrology, precision measurement", and a UK Measurement Advisory Committee Member.

    Jane Jiang’s main research includes: development of mathematical models and algorithms for form and surface texture analysis, filtration and parametric characterisation; optical interferometry techniques for measurement of ultra-precision micro/nano-scale surface topography. Prof. Jiang has published over 200 papers and author/co-authored 8 books on measurement science and surface/precision metrology. She is a Royal Society Senior Research Fellow and holds a Wolfson Research Merit Award. Jane was awarded the UK Outstanding Asian Woman of Achievement in 2006. Prof. Jiang is an elected Fellow of IET and RSA.